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I. Farrer (4)

Identifiers

  • name variant I. Farrer (4) 0.60 · backfill

Papers (1)

  1. Probing the Sensitivity of Electron Wave Interference to Disorder-Induced Scattering in Solid-State Devices cond-mat.mes-hall · 2011 · author #9

Mentions

  • 1106.5823 #9 · backfill · confidence 0.70 I. Farrer (4)

Frequent Coauthors