pith. sign in

National Taiwan Normal University

Identifiers

  • name variant National Taiwan Normal University 0.60 · backfill

Papers (1)

  1. Origin of defects responsible for charge transport in resistive random access memory based on hafnia cond-mat.mes-hall · 2013 · author #21

Mentions

  • 1309.0071 #21 · backfill · confidence 0.70 National Taiwan Normal University

Frequent Coauthors