M. Nivard

Identifiers

• name variant M. Nivard 0.60 · backfill

Papers (1)

1. A method for measuring the contact area in instrumented indentation testing by tip scanning probe microscopy imaging cond-mat.mtrl-sci · 2013 · author #3

Mentions

• 1311.2140 #3 · backfill · confidence 0.70 M. Nivard

Frequent Coauthors

• J.-C. Sangleb{\oe}uf 1 shared papers
• J.-P. Guin 1 shared papers
• L. Charleux 1 shared papers
• V. Keryvin 1 shared papers
• Y. Yokoyama 1 shared papers