T. M\'elin

Identifiers

• name variant T. M\'elin 0.60 · backfill

Papers (1)

1. Characterization of ion/electron beam induced deposition of electrical contacts at the sub-{\mu}m scale cond-mat.mes-hall · 2011 · author #6

Mentions

• 1103.1975 #6 · backfill · confidence 0.70 T. M\'elin

Frequent Coauthors

• D. Brunel 1 shared papers
• D. Deresmes 1 shared papers
• D. Hourlier 1 shared papers
• D. Troadec 1 shared papers
• M Zdrojek 1 shared papers