{"paper":{"title":"A simple TEM method for fast thickness characterization of suspended graphene flakes","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":["cond-mat.mes-hall","cond-mat.soft","physics.chem-ph","physics.data-an"],"primary_cat":"cond-mat.mtrl-sci","authors_text":"Klaus Leifer, Stefano Rubino, Sultan Akhtar","submitted_at":"2012-10-08T15:29:37Z","abstract_excerpt":"We present a simple and fast method for thickness characterization of suspended graphene flakes that is based on transmission electron microscopy (TEM) techniques. For this method, the dynamical theory of electron diffraction (Bloch-wave approach in two-beam case approximation) was used to obtain an analytical expression for the intensity of the transmitted electron beam I0(t), as function of the specimen thickness t for thin samples (t<< {\\lambda}; where {\\lambda} is the absorption constant for graphite). We show that in thin graphite crystals the transmitted intensity is a linear function of"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1210.2307","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}