{"paper":{"title":"Electrochemical Strain Microscopy of Silica Glasses","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"cond-mat.mes-hall","authors_text":"Roger Proksch","submitted_at":"2013-12-25T06:45:08Z","abstract_excerpt":"Piezoresponse Force Microscopy (PFM) and Electrochemical Strain Microscopy (ESM) are two related techniques that have had considerable success in nano-scale probing of functional material properties. Both measure the strain of the sample in response to a localized electric field beneath a sharp conductive tip. In this work, a collection of commercially available glass samples were measured with a variety of Si cantilevers coated with different conductive metals. In some cases, these glasses showed significant hysteresis loops, similar in appearance to those measured on ferroelectric materials "},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1312.6933","kind":"arxiv","version":2},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}