{"paper":{"title":"Histogram-Based Flash Channel Estimation","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":["math.IT"],"primary_cat":"cs.IT","authors_text":"Haobo Wang, Richard D. Wesel, Tsung-Yi Chen","submitted_at":"2014-10-29T20:46:02Z","abstract_excerpt":"Current generation Flash devices experience significant read-channel degradation from damage to the oxide layer during program and erase operations. Information about the read-channel degradation drives advanced signal processing methods in Flash to mitigate its effect. In this context, channel estimation must be ongoing since channel degradation evolves over time and as a function of the number of program/erase (P/E) cycles. This paper proposes a framework for ongoing model-based channel estimation using limited channel measurements (reads). This paper uses a channel model characterizing degr"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1410.8158","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}