{"paper":{"title":"Electronic correlation effects and Coulomb gap in the Si(111)-$(\\sqrt{3}\\times\\sqrt{3})$-Sn surface","license":"http://creativecommons.org/publicdomain/zero/1.0/","headline":"","cross_cats":["cond-mat.mes-hall"],"primary_cat":"cond-mat.str-el","authors_text":"A.A. Maizlakh, A.B. Odobescu, N.I. Fedotov, S.V. Zaitsev-Zotov","submitted_at":"2016-12-15T09:18:28Z","abstract_excerpt":"Electronic transport properties of the Si(111)-$(\\sqrt{3}\\times\\sqrt{3})$-Sn surface formed on low doped Si substrates are studied using two-probe conductivity measurements and tunnelling spectroscopy. We demonstrate that the ground state corresponds to Mott-Hubbard insulator with a band gap $2\\Delta = 70$meV, which vanishes quickly upon temperature increase. The temperature dependence of the surface conductivity above $T > 50$K corresponds to the Efros-Shklovskii hopping conduction law. The energy gap at the Fermi level observed in tunnelling spectroscopy measurements at higher temperatures c"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1612.04989","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}