{"paper":{"title":"Design and Test of Wire-Scanners for SwissFEL","license":"http://creativecommons.org/licenses/by-nc-sa/4.0/","headline":"","cross_cats":["physics.acc-ph"],"primary_cat":"physics.ins-det","authors_text":"A. Kammerer, B. Rippstein, C. Ozkan, C. Seiler, D. Zimoch, F. L\\\"ohl, G. L. Orlandi, H. Brands, L. Schulz, M. Baldinger, P. Heimgartner, P. MohanMurthy, P. Valitutti, R. Ischebeck, R. L\\\"uscher, S. Trovati, V. Schlott","submitted_at":"2016-11-01T07:39:40Z","abstract_excerpt":"The SwissFEL light-facility will provide coherent X-rays in the wavelength region 7-0.7 nm and 0.7-0.1 nm. In SwissFEL, view-screens and wire-scanners will be used to monitor the transverse profile of a 200/10pC electron beam with a normalized emittance of 0.4/0.2 mm.mrad and a final energy of 5.8 GeV. Compared to view screens, wire-scanners offer a quasi-non-destructive monitoring of the beam transverse profile without suffering from possible micro-bunching of the electron beam. The main aspects of the design, laboratory characterization and beam-test of the SwissFEL wire-scanner prototype wi"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1611.00151","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}