{"paper":{"title":"Finite element analysis of surface-stress effects in the Si lattice-parameter measurement","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":["physics.comp-ph"],"primary_cat":"cond-mat.mtrl-sci","authors_text":"Carlo Sasso, Danilo Quagliotti, Enrico Massa, Giovanni Mana, Ulrich Kuetgens","submitted_at":"2013-02-19T11:16:21Z","abstract_excerpt":"A stress exists in solids surfaces, similarly to liquids, also if the underlying bulk material is stress-free. This paper investigates the surface stress effect on the measured value of the Si lattice parameter used to determine the Avogadro constant by counting Si atoms. An elastic-film model has been used to provide a surface load in a finite element analysis of the lattice strain of the x-ray interferometer crystal used to measure the lattice parameter. Eventually, an experiment is proposed to work a lattice parameter measurement out so that there is a visible effect of the surface stress."},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1302.4578","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}