{"paper":{"title":"Roughness fluctuations, roughness exponents and the universality class of ballistic deposition","license":"","headline":"","cross_cats":["cond-mat.mtrl-sci"],"primary_cat":"cond-mat.stat-mech","authors_text":"Fabio D. A. Aarao Reis","submitted_at":"2005-10-03T21:45:53Z","abstract_excerpt":"In order to estimate roughness exponents of interface growth models, we propose the calculation of effective exponents from the roughness fluctuation (sigma) in the steady state. We compare the finite-size behavior of these exponents and the ones calculated from the average roughness <w_2> for two models in the 2+1-dimensional Kardar-Parisi-Zhang (KPZ) class and for a model in the 1+1-dimensional Villain-Lai-Das Sarma (VLDS) class. The values obtained from sigma provide consistent asymptotic estimates, eventually with smaller finite-size corrections. For the VLDS (nonlinear molecular beam epit"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"cond-mat/0510058","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}