{"paper":{"title":"Evidence for In-Plane Tetragonal c-axis in Mn$_x$Ga$_{1-x}$ Thin Films using Transmission Electron Microscopy","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"cond-mat.mtrl-sci","authors_text":"C. Felser, F. Albertini, F. Casoli, J. Karel, L. Nasi, L. Righi, P. Lupo, S. Fabbrici","submitted_at":"2015-04-13T07:55:32Z","abstract_excerpt":"Tetragonal Mn$_x$Ga$_{1-x}$ (x=0.70, 0.75) thin films grown on SrTiO$_3$ substrates at different temperatures and thicknesses exhibit perpendicular magnetic anisotropy with coercive fields between 1-2 T. Transmission electron microscopy (TEM) and X-ray diffraction (XRD) reveal that 40nm samples grown at 300-350$^{o}$C lead to polycrystalline films with the tetragonal c-axis oriented primarily perpendicular to the film plane but with some fraction of the sample exhibiting the c-axis in the film plane. This structure results in a secondary magnetic component in the out of plane magnetization. Gr"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1504.03085","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}