{"paper":{"title":"Identification of high energy ions using backscattered particles in laser-driven ion acceleration with cluster-gas targets","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":["physics.acc-ph","physics.atm-clus","physics.ins-det"],"primary_cat":"physics.plasm-ph","authors_text":"A. S. Pirozhkov, A. Ya. Faenov, A. Yogo, H. Kiriyama, H. Sakaki, K. Kondo, K. Oda, M. Kanasaki, M. Kando, M. Tampo, S. Jinno, S. Kurashima, S. V. Bulanov, T. A. Pikuz, T. Kamiya, T. Shimomura, T. Yamauchi, Y. Fukuda, Y. Hayashi","submitted_at":"2011-12-21T08:30:25Z","abstract_excerpt":"A new diagnosis method for high energy ions utilizing a single CR-39 detector mounted on plastic plates is demonstrated to identify the presence of the high energy component beyond the CR-39's detection threshold limit. On irradiation of the CR-39 detector unit with a 25 MeV per nucleon He ion beam from conventional rf-accelerators, a large number of etch pits having elliptical opening shapes are observed on the rear surface of the CR-39. Detailed investigations reveal that these etch pits are created by heavy ions inelastically backscattered from the plastic plates. This ion detection method "},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1112.4948","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}