{"paper":{"title":"X-ray microtomography of heavy microstructures: the case of Plasma-Sprayed Tungsten and Tungsten-Steel MMC","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"cond-mat.mtrl-sci","authors_text":"A.Larrue, A. Zivelonghi, J-H. You, T. Weitkamp","submitted_at":"2015-07-27T19:59:42Z","abstract_excerpt":"In this paper synchrotron microtomography on Plasma Sprayed Tungsten (PS-W) is presented and discussed. PS-W is a challenging material for microtomography since it exhibits a random porous network at different length-scales (from nanometers to micrometers) and is hardly penetrable by X-rays. Furthermore, inner porosity causes strong internal scattering. The key challenges were, firstly, to optimize the beam parameters considering the inherent trade-off between photon energy (penetration depth) and spatial resolution and, secondly, to develop effective signal filtering algorithms. Despite the l"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1507.07547","kind":"arxiv","version":3},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}