{"paper":{"title":"Impact of Surface Treatment on Noise in PL-Measurements of Silicon Vacancies in 4H-SiC Lateral pin-Diodes","license":"http://creativecommons.org/licenses/by/4.0/","headline":"","cross_cats":[],"primary_cat":"quant-ph","authors_text":"2), 2) ((1) Chair of Electron Devices at Friedrich-Alexander-Universit\\\"at Erlangen-N\\\"urnberg, (2) Fraunhofer Institute for Integrated Systems, (3) Department of Energy Materials, (4) Intego GmbH, (5) Leibniz-Institut f\\\"ur Oberfl\\\"achenmodifizierung, (6) Department of Modern Physics, Alexander May (2), Chihang Luo (6), Christian Gobert (2), Christian Miersch (3), Devices Technology, Device Technology, Fabian Magerl (1), Franziska C. Beyer (3), Heino M\\\"oller (4), Jan F. Dick (1, Jannik H. Schwarberg (1), J\\\"org Schulze (1, Martin Siebert (3), Mathias Rommel (2), Susanne Beuer (2), Technology of China), Test Devices at Fraunhofer Institute for Integrated Systems, University of Science, Wolfgang Knolle (5)","submitted_at":"2026-05-22T19:24:39Z","abstract_excerpt":"Silicon vacancies ($V_\\mathrm{Si}$) in 4H-SiC are promising candidates for quantum technologies due to their long spin coherence times and integrability into mature semiconductor platforms. However, conventional CMOS-compatible processing introduces significant photoluminescence noise from passivation layers and crystal damage, degrading color center coherence and excitation linewidths. This work evaluates strategies to minimize such background noise. Thermally grown oxides with nitrogen monoxide annealing provide excellent low-noise passivation, remaining stable during subsequent $600\\,^{\\cir"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"2605.24157","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"integrity":{"clean":true,"summary":{"advisory":0,"critical":0,"by_detector":{},"informational":0},"endpoint":"/pith/2605.24157/integrity.json","findings":[],"available":true,"detectors_run":[],"snapshot_sha256":"c28c3603d3b5d939e8dc4c7e95fa8dfce3d595e45f758748cecf8e644a296938"},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}