{"paper":{"title":"Fractal analysis of Sampled Profiles: Systematic Study","license":"","headline":"","cross_cats":[],"primary_cat":"cond-mat.stat-mech","authors_text":"A. Podest\\`a, C. Castelnovo, P. Milani, P. Piseri","submitted_at":"2001-10-01T16:27:26Z","abstract_excerpt":"A quantitative evaluation of the influence of sampling on the numerical fractal analysis of experimental profiles is of critical importance. Although this aspect has been widely recognized, a systematic analysis of the sampling influence is still lacking. Here we present the results of a systematic analysis of synthetic self-affine profiles in order to clarify the consequences of the application of a poor sampling (up to 1000 points) typical of Scanning Probe Microscopy for the characterization of real interfaces and surfaces. We interprete our results in term of a deviation and a dispersion o"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"cond-mat/0110031","kind":"arxiv","version":2},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}