{"paper":{"title":"Semi-supervised deep learning by metric embedding","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"cs.LG","authors_text":"Elad Hoffer, Nir Ailon","submitted_at":"2016-11-04T16:39:20Z","abstract_excerpt":"Deep networks are successfully used as classification models yielding state-of-the-art results when trained on a large number of labeled samples. These models, however, are usually much less suited for semi-supervised problems because of their tendency to overfit easily when trained on small amounts of data. In this work we will explore a new training objective that is targeting a semi-supervised regime with only a small subset of labeled data. This criterion is based on a deep metric embedding over distance relations within the set of labeled samples, together with constraints over the embedd"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1611.01449","kind":"arxiv","version":2},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}