{"paper":{"title":"Reconstruction of partially sampled multi-band images - Application to STEM-EELS imaging","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":["cond-mat.mtrl-sci","cs.CV","physics.data-an"],"primary_cat":"eess.IV","authors_text":"\\'Etienne Monier, Marcel Tenc\\'e, Marta de Frutos, Nathalie Brun, Nicolas Dobigeon, Thomas Oberlin","submitted_at":"2018-02-27T18:46:27Z","abstract_excerpt":"Electron microscopy has shown to be a very powerful tool to map the chemical nature of samples at various scales down to atomic resolution. However, many samples can not be analyzed with an acceptable signal-to-noise ratio because of the radiation damage induced by the electron beam. This is particularly crucial for electron energy loss spectroscopy (EELS) which acquires spectral-spatial data and requires high beam intensity. Since scanning transmission electron microscopes (STEM) are able to acquire data cubes by scanning the electron probe over the sample and recording a spectrum for each sp"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1802.10066","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}