{"paper":{"title":"Adaptive Scan for Atomic Force Microscopy Based on Online Optimisation: Theory and Experiment","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"eess.SP","authors_text":"Chris Manzie, Dragan Nesic, Kaixiang Wang, Michael G. Ruppert, Yuen K. Yong","submitted_at":"2019-02-12T01:31:47Z","abstract_excerpt":"A major challenge in Atomic Force Microscopy (AFM) is to reduce the scan duration while retaining the image quality. Conventionally, the scan rate is restricted to a sufficiently small value in order to ensure a desirable image quality as well as a safe tip-sample contact force. This usually results in a conservative scan rate for samples that have a large variation in aspect ratio and/or for scan patterns that have a varying linear velocity. In this paper, an adaptive scan scheme is proposed to alleviate this problem. A scan line-based performance metric balancing both imaging speed and accur"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1902.04209","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}