{"paper":{"title":"Redundancy allocation in finite-length nested codes for nonvolatile memories","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":["math.IT"],"primary_cat":"cs.IT","authors_text":"B. V. K. Vijaya Kumar, Yongjune Kim","submitted_at":"2018-02-28T22:29:15Z","abstract_excerpt":"In this paper, we investigate the optimum way to allocate redundancy of finite-length nested codes for modern nonvolatile memories suffering from both permanent defects and transient errors (erasures or random errors). A nested coding approach such as partitioned codes can handle both permanent defects and transient errors by using two parts of redundancy: 1) redundancy to deal with permanent defects and 2) redundancy for transient errors. We consider two different channel models of the binary defect and erasure channel (BDEC) and the binary defect and symmetric channel (BDSC). The transient e"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1803.00117","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}