{"paper":{"title":"Bypassing the Combinatorial Explosion: Using Similarity to Generate and Prioritize T-wise Test Suites for Large Software Product Lines","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"cs.SE","authors_text":"Christopher Henard (SnT), Gilles Perrouin (PReCISE), INRIA Lille - Nord Europe, Jacques Klein (SnT), LIFL), Mike Papadakis (SnT), Patrick Heymans (PReCISE, S'nT), Yves Le Traon (Uni.lu","submitted_at":"2012-11-23T09:47:12Z","abstract_excerpt":"Software Product Lines (SPLs) are families of products whose commonalities and variability can be captured by Feature Models (FMs). T-wise testing aims at finding errors triggered by all interactions amongst t features, thus reducing drastically the number of products to test. T-wise testing approaches for SPLs are limited to small values of t -- which miss faulty interactions -- or limited by the size of the FM. Furthermore, they neither prioritize the products to test nor provide means to finely control the generation process. This paper offers (a) a search-based approach capable of generati"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1211.5451","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}