{"paper":{"title":"Universal Tc depression by irradiation defects in underdoped and overdoped cuprates","license":"","headline":"","cross_cats":["cond-mat.supr-con"],"primary_cat":"cond-mat.str-el","authors_text":"A.W. Tyler, F. Rullier-Albenque, H. Alloul, J.F. Marucco, P.A. Vieillefond, P. Lejay","submitted_at":"1999-08-27T14:12:26Z","abstract_excerpt":"We report on a study of the influence of defects introduced in the CuO$_{2}$ planes of cuprates in a wide range of hole dopings n. T$_{c}$ and electrical resistivity $\\rho (T)$ measurements have been performed on electron irradiated YBa$_{2}$Cu$_{3}$O$_{7-\\delta}$ and Tl$_{2}$Ba$_{2}$CuO$_{6+x}$ single crystals. A universal scaling between the decrease in T$_{c}$ and $\\UNICODE[m]{0x394}\\rho_{2D}\\UNICODE[m]{0xd7}n$, where $\\UNICODE[m]{0x394}\\rho _{2D}$ is the increase of the 2D-resistance induced by the defects, is found for all the samples investigated here. This demonstrates that n is the rel"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"cond-mat/9908405","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"integrity":{"clean":true,"summary":{"advisory":0,"critical":0,"by_detector":{},"informational":0},"endpoint":"/pith/cond-mat/9908405/integrity.json","findings":[],"available":true,"detectors_run":[],"snapshot_sha256":"c28c3603d3b5d939e8dc4c7e95fa8dfce3d595e45f758748cecf8e644a296938"},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}