{"paper":{"title":"FPGA-Based Material Testing Machine Controller","license":"http://creativecommons.org/licenses/by-nc-nd/4.0/","headline":"","cross_cats":["cond-mat.mtrl-sci","cs.AR","cs.SY"],"primary_cat":"eess.SY","authors_text":"Arev Hambardzumyan, Rafayel Ghasabyan, Vahagn Tamazyan","submitted_at":"2025-06-08T13:37:35Z","abstract_excerpt":"In the realm of contemporary materials testing, the demand for scalability, adaptability, parallelism, and speed has surged due to the proliferation of diverse materials and testing standards. Traditional controller-based systems often fall short in meeting these requirements, resulting in adaptability and processing speed limitations. Conversely, FPGA-based controllers present a multifaceted, high-performance solution. Key advantages of FPGA-based controllers in materials testing encompass reconfiguration capabilities for cost-effective adaptation to evolving materials and standards. FPGAs al"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"2506.07139","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"integrity":{"clean":true,"summary":{"advisory":0,"critical":0,"by_detector":{},"informational":0},"endpoint":"/pith/2506.07139/integrity.json","findings":[],"available":true,"detectors_run":[],"snapshot_sha256":"c28c3603d3b5d939e8dc4c7e95fa8dfce3d595e45f758748cecf8e644a296938"},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}