{"paper":{"title":"X-Band deflecting cavity design for ultra-short bunch length measurement of SXFEL at SINAP","license":"http://creativecommons.org/licenses/by/3.0/","headline":"","cross_cats":["hep-ex"],"primary_cat":"physics.acc-ph","authors_text":"De-Chun Tong, Jian-Hao Tan, Qiang Gu, Wen-Cheng Fang, Zhen-Tang Zhao","submitted_at":"2014-06-03T06:28:55Z","abstract_excerpt":"For the development of the X-ray Free Electron Lasers test facility (SXFEL) at SINAP, ultra-short bunch is the crucial requirement for excellent lasing performance. It's a big challenge for deflecting cavity to measure the length of ultra-short bunch, and higher deflecting gradient is required for higher measurement resolution. X-band travelling wave deflecting structure has features of higher deflecting voltage and compact structure, which is good performance at ultra-short bunch length measurement. In this paper, a new X-band deflecting structure has been designed operated at HEM11-2pi/3 mod"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1406.0587","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}