{"paper":{"title":"Activation energy distribution of dynamical structural defects in RuO$_2$ films","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":["cond-mat.dis-nn"],"primary_cat":"cond-mat.mes-hall","authors_text":"Juhn-Jong Lin, Kuang Hong Gao, Sheng-Shiuan Yeh, Ta-Kang Su, Tsung-Lin Wu","submitted_at":"2018-07-17T10:43:39Z","abstract_excerpt":"Ruthenium dioxide (RuO$_2$) is an important metal widely used in nanoelectronic devices. It plays indispensable roles in the applications as catalyst and supercapacitors. A good understanding of the origin of the flicker or 1/$f$ noise in RuO$_2$ will advance the design and efficiency of these applications. We demonstrate in a series of sputtered RuO$_2$ polycrystalline films that the 1/$f$ noise originates from fluctuating oxygen vacancies which act as dynamical structural defects, i.e., moving scattering centers. Reducing the number of oxygen vacancies by adjusting thermal annealing conditio"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1807.06330","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}