{"paper":{"title":"Surface buckling of phosphorene materials: determination, origin and influence on electronic structure","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"cond-mat.mtrl-sci","authors_text":"James Hone, Jerzy T. Sadowski, Jiadong Zang, Jie-Xiang Yu, Jr., Karsten Pohl, Maxwell Grady, Richard M. Osgood, Wencan Jin, Young Duck Kim, Zhongwei Dai","submitted_at":"2017-04-23T00:49:11Z","abstract_excerpt":"The surface structure of phosphorene crystals materials is determined using surface sensitive dynamical micro-spot low energy electron diffraction ({\\mu}LEED) analysis using a high spatial resolution low energy electron microscopy (LEEM) system. Samples of (\\textit{i}) crystalline cleaved black phosphorus (BP) at 300 K and (\\textit{ii}) exfoliated few-layer phosphorene (FLP) of about 10 nm thicknes, which were annealed at 573 K in vacuum were studied. In both samples, a significant surface buckling of 0.22 {\\AA} and 0.30 {\\AA}, respectively, is measured, which is one order of magnitude larger "},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1704.06866","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}