{"paper":{"title":"Metrology and 1/f noise: linear regressions and confidence intervals in flicker noise context","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"physics.data-an","authors_text":"Eric Lantz, Francois Vernotte","submitted_at":"2014-07-29T15:51:41Z","abstract_excerpt":"1/f noise is very common but is difficult to handle in a metrological way. After having recalled the main characteristics of stongly correlated noise, this paper will determine relationships giving confidence intervals over the arithmetic mean and the linear drift parameters. A complete example of processing of an actual measurement sequence affected by 1/f noise will be given."},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1407.7760","kind":"arxiv","version":6},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}