{"paper":{"title":"A Survey on Foundation-Model-Based Industrial Defect Detection","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"cs.CV","authors_text":"Jiadong Yan, Juntao Li, Ke Zhang, Luyao Chang, Tianle Yang, Zhi Wang","submitted_at":"2025-02-26T12:49:27Z","abstract_excerpt":"As industrial products become abundant and sophisticated, visual industrial defect detection receives much attention, including two-dimensional and three-dimensional visual feature modeling. Traditional methods use statistical analysis, abnormal data synthesis modeling, and generation-based models to separate product defect features and complete defect detection. Recently, the emergence of foundation models has brought visual and textual semantic prior knowledge. Many methods are based on foundation models (FM) to improve the accuracy of detection, but at the same time, increase model complexi"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"2502.19106","kind":"arxiv","version":2},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"integrity":{"clean":true,"summary":{"advisory":0,"critical":0,"by_detector":{},"informational":0},"endpoint":"/pith/2502.19106/integrity.json","findings":[],"available":true,"detectors_run":[],"snapshot_sha256":"c28c3603d3b5d939e8dc4c7e95fa8dfce3d595e45f758748cecf8e644a296938"},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}