{"paper":{"title":"Sub-Attosecond Metrology via X-Ray Hong-Ou-Mandel Effect","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"quant-ph","authors_text":"S. Shwartz, S. Volkovich","submitted_at":"2019-08-05T12:48:58Z","abstract_excerpt":"We show that sub-attosecond delays and sub-Angstrom optical path differences can be measured by using Hong-Ou-Mandel interference measurements with x-rays. We propose to use a system comprising a source based on spontaneous parametric down-conversion for the generation of broadband x-ray photon pairs and a multilayer-based interferometer. The correlation time of the photon pairs and the Hong-Ou-Mandel dip are shorter than 1 attosecond, hence the precision of the measurements is expected to be better than 0.1 attosecond. We anticipate that the scheme we describe in this work will lead to the de"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1908.01592","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"integrity":{"clean":true,"summary":{"advisory":0,"critical":0,"by_detector":{},"informational":0},"endpoint":"/pith/1908.01592/integrity.json","findings":[],"available":true,"detectors_run":[],"snapshot_sha256":"c28c3603d3b5d939e8dc4c7e95fa8dfce3d595e45f758748cecf8e644a296938"},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}