{"paper":{"title":"MicroMegascope","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"physics.ins-det","authors_text":"Agasthya Aroul Mogane, Alessandro Siria, Antoine Lain\\'e, Antoine Nigu\\`es, Axel Laborieux, Jean Comtet, Laetitia Jubin, Luca Canale, Lyd\\'eric Bocquet","submitted_at":"2018-05-14T15:29:40Z","abstract_excerpt":"Atomic Force Microscopy (AFM) allows to reconstruct the topography of surface with a resolution in the nanometer range. The exceptional resolution attainable with the AFM makes this instrument a key tool in nanoscience and technology. The core of the set-up relies on the detection of the mechanical properties of a micro-oscillator when approached to a sample to image. Despite the fact that AFM is nowadays a very common instrument for research and development applications, thanks to the exceptional performances and the relative simplicity to use it, the fabrication of the micrometric scale mech"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1805.05231","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}