{"paper":{"title":"Zero-loss/deflection map analysis","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"physics.gen-ph","authors_text":"E. Mandell, K. Pisane, P. Fraundorf, R. Collins","submitted_at":"2012-03-28T19:15:47Z","abstract_excerpt":"Experimental plots of the fraction of detected electrons removed from the zero-loss peak, versus the fraction of incident electrons scattered outside of the objective aperture, can serve as a robust fingerprint of object-contrast in an energy filtered transmission electron microscope (EFTEM). Examples of this, along with the first in a series of models for interpreting the resulting patterns, were presented at the August 2010 meeting of the Microscope Society of America meeting in Portland, Oregon, and published in {\\em Microscopy and MicroAnalysis} {\\bf 16}, Supplement 2, pages 1534-1535 by C"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1203.6342","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}