{"paper":{"title":"Early Development of UVM based Verification Environment of Image Signal Processing Designs using TLM Reference Model of RTL","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"cs.SE","authors_text":"Abhishek Jain, Dr. Hima Gupta, Krishna Kumar, Sandeep Jana","submitted_at":"2014-08-06T00:20:34Z","abstract_excerpt":"With semiconductor industry trend of smaller the better, from an idea to a final product, more innovation on product portfolio and yet remaining competitive and profitable are few criteria which are culminating into pressure and need for more and more innovation for CAD flow, process management and project execution cycle. Project schedules are very tight and to achieve first silicon success is key for projects. This necessitates quicker verification with better coverage matrix. Quicker Verification requires early development of the verification environment with wider test vectors without wait"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1408.1150","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}