{"paper":{"title":"A Heavy Ion Monitor on a Chip Based on a Non-Volatile Memory Architecture -- Part II: Device Characterization & Modeling","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"A non-volatile memory chip detects heavy ions by registering threshold voltage shifts that match detailed simulations.","cross_cats":[],"primary_cat":"physics.ins-det","authors_text":"Clayton Fullwood, Dale Julson, David Keltner, Hannah Lowrey, Mike Youngs, Tim Hossain","submitted_at":"2026-05-15T19:59:15Z","abstract_excerpt":"Building on the demonstrated sensitivity of the Heavy Ion Monitor on a Chip (HIMoC) presented in Part I of this work, we performed additional irradiation exposures using 24.8 MeV/u beams of $^{14}$N, $^{22}$Ne, and $^{40}$Ar at the Texas A&M University Cyclotron Institute. A novel simulation workflow was developed that couples the particle-transport toolkit Geant4 with the open-source TCAD simulator DEVSIM to model the heavy-ion-induced signal in HIMoC devices. The model represents energy deposition by primary heavy ions and secondary electrons as Gaussian charge-loss profiles that produce mea"},"claims":{"count":4,"items":[{"kind":"strongest_claim","text":"Good agreement between simulated and experimental ΔV_th distributions was obtained. HIMoC was also shown to generate a signal that scales approximately linearly with a dose-like quantity proportional to ion fluence, LET, and active detector area.","source":"verdict.strongest_claim","status":"machine_extracted","claim_id":"C1","attestation":"unclaimed"},{"kind":"weakest_assumption","text":"The assumption that heavy-ion energy deposition and secondary-electron effects can be adequately captured by Gaussian charge-loss profiles inside the DEVSIM model without additional free parameters tuned to the specific device or ion species (abstract, modeling workflow description).","source":"verdict.weakest_assumption","status":"machine_extracted","claim_id":"C2","attestation":"unclaimed"},{"kind":"one_line_summary","text":"HIMoC devices produce threshold-voltage shifts from 24.8 MeV/u heavy ions that are modeled as Gaussian charge-loss profiles and scale linearly with fluence times LET times area.","source":"verdict.one_line_summary","status":"machine_extracted","claim_id":"C3","attestation":"unclaimed"},{"kind":"headline","text":"A non-volatile memory chip detects heavy ions by registering threshold voltage shifts that match detailed simulations.","source":"verdict.pith_extraction.headline","status":"machine_extracted","claim_id":"C4","attestation":"unclaimed"}],"snapshot_sha256":"a9eaa48c04c91b35ee3ea8edd888258a7348487d878ad665288aec028e110168"},"source":{"id":"2605.16597","kind":"arxiv","version":1},"verdict":{"id":"cdd6375c-c190-4cf4-9227-c342feb08538","model_set":{"reader":"grok-4.3"},"created_at":"2026-05-19T20:49:06.042825Z","strongest_claim":"Good agreement between simulated and experimental ΔV_th distributions was obtained. HIMoC was also shown to generate a signal that scales approximately linearly with a dose-like quantity proportional to ion fluence, LET, and active detector area.","one_line_summary":"HIMoC devices produce threshold-voltage shifts from 24.8 MeV/u heavy ions that are modeled as Gaussian charge-loss profiles and scale linearly with fluence times LET times area.","pipeline_version":"pith-pipeline@v0.9.0","weakest_assumption":"The assumption that heavy-ion energy deposition and secondary-electron effects can be adequately captured by Gaussian charge-loss profiles inside the DEVSIM model without additional free parameters tuned to the specific device or ion species (abstract, modeling workflow description).","pith_extraction_headline":"A non-volatile memory chip detects heavy ions by registering threshold voltage shifts that match detailed simulations."},"integrity":{"clean":true,"summary":{"advisory":0,"critical":0,"by_detector":{},"informational":0},"endpoint":"/pith/2605.16597/integrity.json","findings":[],"available":true,"detectors_run":[{"name":"doi_compliance","ran_at":"2026-05-19T21:02:10.900507Z","status":"completed","version":"1.0.0","findings_count":0},{"name":"doi_title_agreement","ran_at":"2026-05-19T21:01:19.335734Z","status":"completed","version":"1.0.0","findings_count":0},{"name":"claim_evidence","ran_at":"2026-05-19T19:21:56.821617Z","status":"completed","version":"1.0.0","findings_count":0},{"name":"ai_meta_artifact","ran_at":"2026-05-19T18:33:26.603205Z","status":"skipped","version":"1.0.0","findings_count":0}],"snapshot_sha256":"6b917273bfcc91261d85ad389896e829a0d018e61c3be578dbe234a02523f4a2"},"references":{"count":34,"sample":[{"doi":"10.1016/j.nima.2025.170221","year":2025,"title":"A Heavy Ion Monitor on a Chip based on a non-volatile memory architecture","work_id":"f1e006fe-5650-496b-8564-cde6ef82288c","ref_index":1,"cited_arxiv_id":"","is_internal_anchor":false},{"doi":"10.1080/26896583.2021.1897273","year":2021,"title":"2021 Everything you wanted to know about space radiation but were afraid to ask.Journal of Environmental Science and Health, Part C39, 113–128","work_id":"1638266b-1e3e-4cce-8a0f-e08c3182d88a","ref_index":2,"cited_arxiv_id":"","is_internal_anchor":false},{"doi":"10.1016/j.lssr.2023.01.003","year":2023,"title":"Results from the Radiation Assessment Detector on the International Space Station: Part 1, the Charged Particle Detector","work_id":"2da3a196-363f-47b4-97cd-4991c92bf079","ref_index":3,"cited_arxiv_id":"","is_internal_anchor":false},{"doi":"10.1016/j.lssr.2023.03.004","year":2023,"title":"HERA: A Timepix-based radiation detection system for Exploration-class space missions","work_id":"afcac35f-0708-4dd9-987d-1237c3a8c321","ref_index":4,"cited_arxiv_id":"","is_internal_anchor":false},{"doi":"10.1016/j.lssr.2023.08.004","year":2023,"title":"The importance of time-resolved per- sonal Dosimetry in space: The ISS Crew Active Dosime- ter","work_id":"18b3e9a6-11f9-4a27-9ae0-240e5619eb92","ref_index":5,"cited_arxiv_id":"","is_internal_anchor":false}],"resolved_work":34,"snapshot_sha256":"fb9fc63c8733b88c9e895936ac6135d4532370a9e07e25018c767e39e265124a","internal_anchors":0},"formal_canon":{"evidence_count":2,"snapshot_sha256":"f93843d72ca5100e4a9dfe24927c756f88329550c88cc5d8f6414848f038e2de"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}