{"paper":{"title":"Valley Engineering in Bilayer WSe$_2$ Gate-All-Around Transistors","license":"http://creativecommons.org/licenses/by/4.0/","headline":"","cross_cats":["cond-mat.mtrl-sci"],"primary_cat":"cond-mat.mes-hall","authors_text":"Katsunori Wakabayashi, Kazuhito Tsukagoshi, Souren Adhikary","submitted_at":"2026-06-08T02:58:00Z","abstract_excerpt":"In bilayer WSe$_2$, interlayer coupling reduces the K--$\\Gamma$ valley splitting to $\\Delta_{K\\Gamma} \\approx k_BT$ at room temperature, placing two hole-transport channels of markedly different effective mass in near-thermal equilibrium. We combine density functional theory (DFT) with spin--orbit coupling and an analytical two-valley device model to quantify how this near-degeneracy governs hole transport in gate-all-around (GAA) field-effect transistors. Three main results are obtained: (i)~the subthreshold swing is protected near $60$~mV~dec$^{-1}$ by quantum-capacitance screening independe"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"2606.08955","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"integrity":{"clean":true,"summary":{"advisory":0,"critical":0,"by_detector":{},"informational":0},"endpoint":"/pith/2606.08955/integrity.json","findings":[],"available":true,"detectors_run":[],"snapshot_sha256":"c28c3603d3b5d939e8dc4c7e95fa8dfce3d595e45f758748cecf8e644a296938"},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}