{"paper":{"title":"Thickness Measurements from Single X-ray Phase-contrast Speckle Projection","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"physics.med-ph","authors_text":"Jingchen Ma, Jun Zhao, Rongbiao Tang, Yan Xi","submitted_at":"2015-04-24T04:19:13Z","abstract_excerpt":"We propose a one-shot thickness measurement method for sponge-like structures using a propagation-based X-ray phase-contrast imaging (P-PCI) method. In P-PCI, the air-material interface refracts the incident X-ray. Refracted many times along their paths by such a structure, incident X-rays propagate randomly within a small divergent angle range, resulting in a speckle pattern in the captured image. We found structure thickness and contrast of a phase-contrast projection are directly related in images. This relationship can be described by a natural logarithm equation. Thus, from the one phase-"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1504.06388","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}