{"paper":{"title":"Photoemission Electron Microscopy as a tool for the investigation of optical near fields","license":"","headline":"","cross_cats":[],"primary_cat":"physics.optics","authors_text":"A. Gloskovskii (1), Germany (2) Max Planck-Institute for Polymer Research, G. Sch\\\"onhense (1), H. Rochholz (2), Mainz), M. Cinchetti (1), M. Kreiter (2) ((1) Johannes Gutenberg-University Mainz, S. A. Nepjiko (1)","submitted_at":"2005-05-25T12:57:20Z","abstract_excerpt":"Photoemission electron microscopy was used to image the electrons photoemitted from specially tailored Ag nanoparticles deposited on a Si substrate (with its native oxide SiO$_{x}$). Photoemission was induced by illumination with a Hg UV-lamp (photon energy cutoff $\\hbar\\omega_{UV}=5.0$ eV, wavelength $\\lambda_{UV}=250$ nm) and with a Ti:Sapphire femtosecond laser ($\\hbar\\omega_{l}=3.1$ eV, $\\lambda_{l}=400$ nm, pulse width below 200 fs), respectively. While homogeneous photoelectron emission from the metal is observed upon illumination at energies above the silver plasmon frequency, at lower "},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"physics/0505177","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}