{"paper":{"title":"A new topological aspect of the arbitrary dimensional topological defects","license":"","headline":"","cross_cats":[],"primary_cat":"hep-th","authors_text":"Ying Jiang, Yishi Duan","submitted_at":"1999-10-29T01:50:49Z","abstract_excerpt":"We present a new generalized topological current in terms of the order parameter field $\\vec \\phi$ to describe the arbitrary dimensional topological defects. By virtue of the $% \\phi$-mapping method, we show that the topological defects are generated from the zero points of the order parameter field $\\vec \\phi$, and the topological charges of these topological defects are topological quantized in terms of the Hopf indices and Brouwer degrees of $\\phi$-mapping under the condition that the Jacobian $% J(\\frac \\phi v)\\neq 0$. When $J(\\frac \\phi v)=0$, it is shown that there exist the crucial case"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"hep-th/9910239","kind":"arxiv","version":3},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}