{"paper":{"title":"Coexistence of diffusive resistance and ballistic persistent current in disordered metallic rings with rough edges: Possible origin of puzzling experimental values","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"cond-mat.mes-hall","authors_text":"J. Feilhauer, M. Mosko","submitted_at":"2013-09-06T09:43:09Z","abstract_excerpt":"Typical persistent current ($I_{typ}$) in a mesoscopic normal metal ring with disorder due to rough edges and random grain boundaries is calculated by a scattering matrix method. In addition, resistance of a corresponding metallic wire is obtained from the Landauer formula and the electron mean free path ($l$) is determined. If disorder is due to the rough edges, a ballistic persistent current $I_{typ} \\simeq e v_F/L$ is found to coexist with the diffusive resistance ($ \\propto L/l$), where $v_F$ is the Fermi velocity and $L \\gg l$ is the ring length. This ballistic current is due to a single "},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1309.1580","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}