{"paper":{"title":"Measuring Nanoscale Stress Intensity Factors with an Atomic Force Microscope","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"physics.class-ph","authors_text":"Kun Han (LMT), Matteo Ciccotti (LCVN), St\\'ephane Roux (LMT)","submitted_at":"2010-02-09T15:15:36Z","abstract_excerpt":"Atomic Force Microscope images of a crack intersecting the free surface of a glass specimen are taken at different stages of subcritical propagation. From the analysis of image pairs, it is shown that a novel Integrated Digital Image Correlation technique allows to measure stress intensity factors in a quantitative fashion. Image sizes as small as 200 nm can be exploited and the surface displacement fields do not show significant deviations from linear elastic solutions down to a 10 nm distance from the crack tip. Moreover, this analysis gives access to the out-of-plane displacement of the fre"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1002.1877","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}