{"paper":{"title":"Point-projection microscopy of nano-localized photoemission currents at sub-40 femtosecond time scales","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":["physics.optics"],"primary_cat":"physics.app-ph","authors_text":"Alexander Paarmann (1), Berlin, Faruk Kre\\v{c}ini\\'c (1), Germany), Jannik Malter (1), Melanie M\\\"uller (1), Ralph Ernstorfer (1) ((1) Fritz-Haber-Institut der Max-Planck-Gesellschaft","submitted_at":"2018-03-05T16:47:11Z","abstract_excerpt":"Femtosecond point-projection microscopy (fs-PPM) is an electron microscopy technique that possesses a combination of high spatio-temporal resolution and sensitivity to local electric fields. This allows it to visualize ultrafast charge carrier dynamics in complex nanomaterials. We benchmark the capability of the fs-PPM technique by imaging the ultrafast dynamics of charge carriers produced by multiphoton ionization of silver nanowires. The space-charge driven motion of photoelectrons is followed on \\mbox{sub-100}\\,nm length scales, while the dynamics are captured on 30-100 fs time scales. The "},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1803.01766","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}