{"paper":{"title":"A Single Shot, Sub-picosecond Beam Bunch Characterization with Electro-optic Techniques","license":"","headline":"","cross_cats":[],"primary_cat":"physics.acc-ph","authors_text":"A. Stillman, C. Ozben, D.M. Lazarus, D. Nikas, L. Kowalski (Montclair State University), R. Burns, R. Larsen, T. Srinivasan-Rao, T. Tsang (Brookhaven National Laboratory), V. Castillo, Y.K. Semertzidis","submitted_at":"2001-10-17T14:01:11Z","abstract_excerpt":"In the past decade, the bunch lengths of electrons in accelerators have decreased dramatically to the range of a few picoseconds \\cite{Uesaka94,Trotz97}. Measurement of the length as well as the longitudinal profile of these short bunches have been a topic of research in a number of institutions \\cite{Uesaka97,Liu97,Hutchins00}. One of the techniques uses the electric field induced by the passage of electrons in the vicinity of a birefringent crystal to change its optical characteristics. Well-established electro-optic techniques can then be used to measure the temporal characteristics of the "},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"physics/0110052","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}