{"paper":{"title":"LR-IAD:Mask-Free Industrial Anomaly Detection with Logical Reasoning","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"cs.CV","authors_text":"Aimin Yang, Feiyan Pang, Peijian Zeng, Zhanbo Wang","submitted_at":"2025-04-28T06:52:35Z","abstract_excerpt":"Industrial Anomaly Detection (IAD) is critical for ensuring product quality by identifying defects. Traditional methods such as feature embedding and reconstruction-based approaches require large datasets and struggle with scalability. Existing vision-language models (VLMs) and Multimodal Large Language Models (MLLMs) address some limitations but rely on mask annotations, leading to high implementation costs and false positives. Additionally, industrial datasets like MVTec-AD and VisA suffer from severe class imbalance, with defect samples constituting only 23.8% and 11.1% of total data respec"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"2504.19524","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"integrity":{"clean":true,"summary":{"advisory":0,"critical":0,"by_detector":{},"informational":0},"endpoint":"/pith/2504.19524/integrity.json","findings":[],"available":true,"detectors_run":[],"snapshot_sha256":"c28c3603d3b5d939e8dc4c7e95fa8dfce3d595e45f758748cecf8e644a296938"},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}