{"paper":{"title":"The simulation of loss of U ions due to charge changing processes in the CSRm ring","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"physics.acc-ph","authors_text":"Guofeng Qu, Jiancheng Yang, Meitang Tang, Peng Li, Peng Shang, Wenheng Zheng, Wenwen Ge, Xiaoping Sha, Zhongshan Li","submitted_at":"2014-09-02T07:28:17Z","abstract_excerpt":"Significant beam loss caused by the charge exchange processes and ions impact induced outgassing play a crucial role in the limitation of the maximum number of accumulated heavy ions during the high intensity operation in the accelerators. With the aim to control beam loss due to charge exchange processes and to confine the generated desorption gas, the tracking of the loss positions and installing the absorber blocks with low-desorption rate material at appropriate locations in the CSRm ring will be taken. The loss simulation of U ions having lost an electron will be presented in this report "},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1409.0619","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}