{"paper":{"title":"Current noise in diffusive SNS junctions in the incoherent MAR regime (a review)","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"cond-mat.supr-con","authors_text":"E.N. Bratus', E.V. Bezuglyi, G. Wendin, V.S. Shumeiko","submitted_at":"2014-12-02T17:27:55Z","abstract_excerpt":"We present a theory for the current shot noise in long diffusive SNS structures with low-resistive interfaces at arbitrary temperatures. In such structures, the noise is mostly generated by normal electron scattering in the N-region. Whereas the $I$-$V$ characteristics are approximately described by Ohm's law, the current noise reveals all characteristic features of the MAR regime: \"giant\" enhancement at low voltages, pronounced SGS, and excess noise at large voltages. The most spectacular feature of the noise in the incoherent MAR regime is a universal finite noise level at zero voltage and a"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1412.0989","kind":"arxiv","version":2},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}