Wide-field NV imaging captured real-time rearrangement of vortices in an NbN film driven by shielding currents under local laser heating.
Flux-trapping characterization for superconducting electronics using a cryogenic widefield N-$V$ diamond microscope
2 Pith papers cite this work. Polarity classification is still indexing.
2
Pith papers citing it
abstract
Magnetic flux trapping is a significant hurdle limiting the reliability and scalability of superconducting electronics, yet tools for imaging flux vortices remain slow or insensitive. We present a cryogenic widefield NV-diamond magnetic microscope capable of rapid, micrometer-scale imaging of flux trapping in superconducting devices. Using this technique, we measure vortex expulsion fields in Nb thin films and patterned strips, revealing a crossover in expulsion behavior between $10$ and $20~\mu$m strip widths. The observed scaling agrees with theoretical models and suggests the influence of film defects on vortex expulsion dynamics. This instrument enables high-throughput magnetic characterization of superconducting materials and circuits, providing new insight for flux mitigation strategies in scalable superconducting electronics.
fields
cond-mat.supr-con 2years
2026 2verdicts
UNVERDICTED 2representative citing papers
Systematic tests show high-aspect-ratio slit moats best sequester flux in shielded environments below 1 microtesla, yet vortices still pin at material defects so moats alone are insufficient.
citing papers explorer
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Wide-field magnetic imaging of shielding-current-driven vortex rearrangement under local heating using diamond quantum sensors
Wide-field NV imaging captured real-time rearrangement of vortices in an NbN film driven by shielding currents under local laser heating.
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Mitigation of Magnetic Flux Trapping in Superconducting Electronics Using Moats
Systematic tests show high-aspect-ratio slit moats best sequester flux in shielded environments below 1 microtesla, yet vortices still pin at material defects so moats alone are insufficient.