SEM orientation contrast enables direct imaging of anti-phase domains in zinc-blende III-V materials, quantified on GaP/GaAs and applied qualitatively to other substrates with image processing revealing preferential boundaries in GaP/Si.
Lucci et al., A Stress-Free and Textured GaP Template on Silicon for Solar Water Splitting, Adv
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Direct Orientation Contrast Imaging of Anti-Phase Domains on III-V Materials Using Scanning Electron Microscopy
SEM orientation contrast enables direct imaging of anti-phase domains in zinc-blende III-V materials, quantified on GaP/GaAs and applied qualitatively to other substrates with image processing revealing preferential boundaries in GaP/Si.