Marginal X-ray polarization detection in atoll source 4U 1735-44 is consistent with a low disk inclination of about 40 degrees inferred from relativistic reflection modeling.
V., Di Marco, A., et al
2 Pith papers cite this work. Polarity classification is still indexing.
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2026 2representative citing papers
The paper presents a conceptual design for a stacked focal-plane polarimeter using multilayer mirrors, imaging photoelectric detectors, and an active Compton polarimeter to extend X-ray polarimetry to tens of keV with improved sensitivity.
citing papers explorer
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X-Ray Polarization from the Atoll 4U 1735-44 Suggests a Low Inclination
Marginal X-ray polarization detection in atoll source 4U 1735-44 is consistent with a low disk inclination of about 40 degrees inferred from relativistic reflection modeling.
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Instruments for Focal Plane X-Ray Polarimetry in the Next Decade
The paper presents a conceptual design for a stacked focal-plane polarimeter using multilayer mirrors, imaging photoelectric detectors, and an active Compton polarimeter to extend X-ray polarimetry to tens of keV with improved sensitivity.