Calculations demonstrate that crystal temperature in dynamically compressed multilayer targets can be deduced from inelastic x-ray scattering spectra in the umklapp regime using Dornheim's formalism, independent of sample texture.
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Ultrafast temperature diagnosis of dynamically compressed matter using millielectronvolt inelastic x-ray scattering beyond the first Brillouin zone
Calculations demonstrate that crystal temperature in dynamically compressed multilayer targets can be deduced from inelastic x-ray scattering spectra in the umklapp regime using Dornheim's formalism, independent of sample texture.