{"schema":"pith.reference-change-event.v1","doi":"10.1038/nature00972","canonical_url":"https://pith.science/event/10.1038/nature00972","json_url":"https://pith.science/event/10.1038/nature00972.json","not_a_judgment":"This page records that a citing paper's bibliography includes a work with a published notice. It is not a judgment on the citing paper.","primary":{"event_id":369459,"doi":"10.1038/nature00972","event_type":"correction","event_type_label":"Correction","source":"crossref","source_label":"Crossref","event_date":"2002-10-25","title":"Erratum: corrigendum: Sub-ångstrom resolution using aberration corrected electron optics","work_title":"Batson, N","work_doi":"10.1038/nature00972","work_arxiv_id":null,"notice_doi":"10.1038/nature01058","flag_count":0,"flags_open":0,"flags_disputed":0,"latest_flag_at":null,"human_href":"/event/10.1038/nature00972","json_href":"/event/10.1038/nature00972.json"},"events":[{"event_id":369459,"doi":"10.1038/nature00972","event_type":"correction","event_type_label":"Correction","source":"crossref","source_label":"Crossref","event_date":"2002-10-25","title":"Erratum: corrigendum: Sub-ångstrom resolution using aberration corrected electron optics","work_title":"Batson, N","work_doi":"10.1038/nature00972","work_arxiv_id":null,"notice_doi":"10.1038/nature01058","flag_count":0,"flags_open":0,"flags_disputed":0,"latest_flag_at":null,"human_href":"/event/10.1038/nature00972","json_href":"/event/10.1038/nature00972.json"}],"flags":[{"id":8632,"status":"open","status_label":"Open","citing_arxiv_id":"2608.03344","citing_title":"Picometre-scale real-time drift correction in TEM and STEM by dynamic control of the specimen stage for atomic-resolution imaging","ref_index":2,"evidence_raw":"microscopy experiments. References 24 [1] M. Haider, S. Uhlemann, E. Schwan, H. Rose, B. Kabius, K. Urban, Electron microscopy image enhanced, Nature 392 (1998) 768-769. https://doi.org/10.1038/33823. [2] P.E. Batson, N. Dellby, O.L. Krivanek, Sub -ångstrom resolution using aberration corrected electron optics, Nature 418 (2002) 617-620. https://doi.org/10.1038/nature00972. [3] B.D.A. Levin, Direct detectors and their applications in electron microscopy for materials science, J. Phys. Mater. 4 (2021) 042005. https://doi.org/10.1088/2515-7639/ac0ff9. [4] J.J.P. Peters, T. Mullarkey, E. Hedley, K.H. Müller, A. Porter, A. Mostaed, L. Jones, Electron counting detectors in scanning transmission electron microscopy via hardware signal","evidence_cleaned":null,"evidence_source_label":"citation context","event_type":"correction","event_type_label":"Correction","source_label":"Crossref","event_date":"2002-10-25","work_title":"Batson, N","work_doi":"10.1038/nature00972","event_doi":"10.1038/nature00972","flag_href":"/flags/8632","event_href":"/event/10.1038/nature00972","paper_href":"/paper/2608.03344","created_at":"2026-08-06T00:19:25.695398Z","dispute_note":null,"disputed_at":null,"disputed_by":null}],"flag_count":1,"flags_open":1,"flags_disputed":0,"desk_url":"https://pith.science/flags"}