In-depth analysis of CIGS film for solar cells, structural and optical characterization

Space-resolved X-ray diffraction measurements performed on gradient-etched CuInGaSe2 (CIGS) solar cells provide information about stress and texture depth profiles in the absorber layer. An important parameter for CIGS layer growth dynamics, the absorber thickness-dependent stress in the molybdenum back contact is analyzed. Texturing of grains and quality of the polycrystalline absorber layer are correlated with the intentional composition gradients (band gap grading). Band gap gradient is determined by space-resolved photoluminescence measurements and correlated with composition and strain profiles.